CIS VCC-5U101SW USB3.2 5MP SWIR Camera | 400–1700nm Global Shutter C-Mount

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The CIS VCC-5U101SW is a high-performance 5MP USB3.2 SWIR camera designed for advanced machine vision, inspection, robotics, UAV/drone imaging, AI vision, semiconductor inspection, food inspection, pharmaceutical inspection, agricultural testing, and process quality control applications.

Built with a 1/1.4-inch Sony IMX992 global shutter CMOS sensor, the VCC-5U101SW detects wavelengths from 400 nm to 1700 nm, allowing a single camera to capture both visible light and short-wave infrared imaging. This makes it ideal for applications where standard visible cameras cannot reveal critical material, moisture, contamination, classification, or defect information.

With USB3 Vision and USB 3.2 Gen 2x1 connectivity, the VCC-5U101SW simplifies system integration by eliminating the need for a frame grabber. Image transmission, camera control, and power are handled through one USB Type-C cable, helping reduce cost, cable complexity, and installation time.

The compact 65 mm cubic body, C-mount lens support, high-speed 131 fps performance, and industrial vision features such as external trigger, ROI, and defect pixel correction make this SWIR camera a powerful choice for OEMs, integrators, laboratories, automation engineers, and industrial inspection systems.

Key Features:

• 5MP SWIR industrial camera
• Detects 400 nm to 1700 nm wavelengths
• Captures visible and SWIR images with one camera
• Sony IMX992 global shutter CMOS sensor
• 2592 x 2056 effective pixel resolution
• Up to 131 fps at maximum resolution
• USB3 Vision and USB 3.2 interface
• USB 3.2 Gen 2x1, 5 Gbps / 10 Gbps support
• Single USB Type-C cable for video, camera control, and power
• No frame grabber required
• External trigger support
• ROI support
• Defect pixel correction
• Compact 65 x 65 x 65 mm cubic housing
• C-mount lens mount
• Designed for machine vision, AI inspection, robotics, UAV, medical, pharmaceutical, semiconductor, and industrial automation applications

Applications:

• Semiconductor inspection
• Electronic board and PCB inspection
• Food inspection and sorting
• Agricultural product testing
• Pharmaceutical and tablet inspection
• Material identification and classification
• Process quality control
• Machine vision inspection
• AI vision and intelligent imaging
• Robotics vision systems
• UAV and drone inspection payloads
• Medical and laboratory imaging
• Industrial automation
• Defect detection
• Moisture and contamination detection
• Security and surveillance imaging where SWIR visibility is required